Is it normal to have RAW_READ_ERROR_RATE value above 0?

R

Red Squirrel

[H]F Junkie
Joined
Nov 29, 2009
Messages
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I bought two hitachi 1TB drives recently and both are showing high values, one even has a warning, so they are both failing and are brand new. A kick in the face. So I ordered two more, and I'm now rebuilding the raid with one of the new ones. The new one now shows a value of 1.

Am I really bad lucky or is this normal? The other 3 drives which are earlier models don't have any value for that, just 0.

This is the reading:


Code: 
=== START OF INFORMATION SECTION ===
Device Model:     Hitachi HDS721010CLA332
Serial Number:    JP9911HZ0L8RKH
Firmware Version: JP4OA3MA
User Capacity:    1,000,204,886,016 bytes
Device is:        Not in smartctl database [for details use: -P showall]
ATA Version is:   8
ATA Standard is:  ATA-8-ACS revision 4
Local Time is:    Sat Feb  5 20:14:14 2011 EST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status:  (0x82)	Offline data collection activity
					was completed without error.
					Auto Offline Data Collection: Enabled.
Self-test execution status:      (   0)	The previous self-test routine completed
					without error or no self-test has ever 
					been run.
Total time to complete Offline 
data collection: 		 (10164) seconds.
Offline data collection
capabilities: 			 (0x5b) SMART execute Offline immediate.
					Auto Offline data collection on/off support.
					Suspend Offline collection upon new
					command.
					Offline surface scan supported.
					Self-test supported.
					No Conveyance Self-test supported.
					Selective Self-test supported.
SMART capabilities:            (0x0003)	Saves SMART data before entering
					power-saving mode.
					Supports SMART auto save timer.
Error logging capability:        (0x01)	Error logging supported.
					General Purpose Logging supported.
Short self-test routine 
recommended polling time: 	 (   1) minutes.
Extended self-test routine
recommended polling time: 	 ( 169) minutes.
SCT capabilities: 	       (0x003d)	SCT Status supported.
					SCT Feature Control supported.
					SCT Data Table supported.

SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE      UPDATED  WHEN_FAILED RAW_VALUE
  1 Raw_Read_Error_Rate     0x000b   100   100   016    Pre-fail  Always       -       1
  2 Throughput_Performance  0x0005   134   134   054    Pre-fail  Offline      -       100
  3 Spin_Up_Time            0x0007   100   100   024    Pre-fail  Always       -       212
  4 Start_Stop_Count        0x0012   100   100   000    Old_age   Always       -       5
  5 Reallocated_Sector_Ct   0x0033   100   100   005    Pre-fail  Always       -       0
  7 Seek_Error_Rate         0x000b   100   100   067    Pre-fail  Always       -       0
  8 Seek_Time_Performance   0x0005   138   138   020    Pre-fail  Offline      -       31
  9 Power_On_Hours          0x0012   100   100   000    Old_age   Always       -       71
 10 Spin_Retry_Count        0x0013   100   100   060    Pre-fail  Always       -       0
 12 Power_Cycle_Count       0x0032   100   100   000    Old_age   Always       -       5
192 Power-Off_Retract_Count 0x0032   100   100   000    Old_age   Always       -       8
193 Load_Cycle_Count        0x0012   100   100   000    Old_age   Always       -       8
194 Temperature_Celsius     0x0002   253   253   000    Old_age   Always       -       23 (Lifetime Min/Max 20/29)
196 Reallocated_Event_Count 0x0032   100   100   000    Old_age   Always       -       0
197 Current_Pending_Sector  0x0022   100   100   000    Old_age   Always       -       0
198 Offline_Uncorrectable   0x0008   100   100   000    Old_age   Offline      -       0
199 UDMA_CRC_Error_Count    0x000a   200   200   000    Old_age   Always       -       0



The two other drives look more serious though:

Code: 
drive 1:

[root@borg rsbackup]# smartctl -a /dev/sde
smartctl version 5.38 [x86_64-redhat-linux-gnu] Copyright (C) 2002-8 Bruce Allen
Home page is http://smartmontools.sourceforge.net/

=== START OF INFORMATION SECTION ===
Device Model:     Hitachi HDS721010CLA332
Serial Number:    JP2940HD034DRC
Firmware Version: JP4OA3EA
User Capacity:    1,000,204,886,016 bytes
Device is:        Not in smartctl database [for details use: -P showall]
ATA Version is:   8
ATA Standard is:  ATA-8-ACS revision 4
Local Time is:    Sat Feb  5 20:07:19 2011 EST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status:  (0x84)	Offline data collection activity
					was suspended by an interrupting command from host.
					Auto Offline Data Collection: Enabled.
Self-test execution status:      (   0)	The previous self-test routine completed
					without error or no self-test has ever 
					been run.
Total time to complete Offline 
data collection: 		 (9988) seconds.
Offline data collection
capabilities: 			 (0x5b) SMART execute Offline immediate.
					Auto Offline data collection on/off support.
					Suspend Offline collection upon new
					command.
					Offline surface scan supported.
					Self-test supported.
					No Conveyance Self-test supported.
					Selective Self-test supported.
SMART capabilities:            (0x0003)	Saves SMART data before entering
					power-saving mode.
					Supports SMART auto save timer.
Error logging capability:        (0x01)	Error logging supported.
					General Purpose Logging supported.
Short self-test routine 
recommended polling time: 	 (   1) minutes.
Extended self-test routine
recommended polling time: 	 ( 167) minutes.
SCT capabilities: 	       (0x003d)	SCT Status supported.
					SCT Feature Control supported.
					SCT Data Table supported.

SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE      UPDATED  WHEN_FAILED RAW_VALUE
  1 Raw_Read_Error_Rate     0x000b   096   096   016    Pre-fail  Always       -       262148
  2 Throughput_Performance  0x0005   135   135   054    Pre-fail  Offline      -       97
  3 Spin_Up_Time            0x0007   118   118   024    Pre-fail  Always       -       320 (Average 322)
  4 Start_Stop_Count        0x0012   100   100   000    Old_age   Always       -       24
  5 Reallocated_Sector_Ct   0x0033   100   100   005    Pre-fail  Always       -       0
  7 Seek_Error_Rate         0x000b   100   100   067    Pre-fail  Always       -       0
  8 Seek_Time_Performance   0x0005   138   138   020    Pre-fail  Offline      -       31
  9 Power_On_Hours          0x0012   100   100   000    Old_age   Always       -       2252
 10 Spin_Retry_Count        0x0013   100   100   060    Pre-fail  Always       -       0
 12 Power_Cycle_Count       0x0032   100   100   000    Old_age   Always       -       23
192 Power-Off_Retract_Count 0x0032   100   100   000    Old_age   Always       -       24
193 Load_Cycle_Count        0x0012   100   100   000    Old_age   Always       -       24
194 Temperature_Celsius     0x0002   253   253   000    Old_age   Always       -       23 (Lifetime Min/Max 18/31)
196 Reallocated_Event_Count 0x0032   100   100   000    Old_age   Always       -       0
197 Current_Pending_Sector  0x0022   100   100   000    Old_age   Always       -       0
198 Offline_Uncorrectable   0x0008   100   100   000    Old_age   Offline      -       0
199 UDMA_CRC_Error_Count    0x000a   200   200   000    Old_age   Always       -       3

SMART Error Log Version: 1
ATA Error Count: 1
	CR = Command Register [HEX]
	FR = Features Register [HEX]
	SC = Sector Count Register [HEX]
	SN = Sector Number Register [HEX]
	CL = Cylinder Low Register [HEX]
	CH = Cylinder High Register [HEX]
	DH = Device/Head Register [HEX]
	DC = Device Command Register [HEX]
	ER = Error register [HEX]
	ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.

Error 1 occurred at disk power-on lifetime: 1838 hours (76 days + 14 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  84 51 09 67 0d ad 09

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  60 28 30 48 0d ad 40 00  20d+04:03:37.681  READ FPDMA QUEUED
  60 10 28 80 09 ad 40 00  20d+04:03:37.680  READ FPDMA QUEUED
  60 28 20 30 f4 ac 40 00  20d+04:03:37.680  READ FPDMA QUEUED
  60 10 00 70 51 10 40 00  20d+04:03:37.680  READ FPDMA QUEUED
  60 10 30 48 71 ed 40 00  20d+04:03:37.674  READ FPDMA QUEUED

SMART Self-test log structure revision number 1
No self-tests have been logged.  [To run self-tests, use: smartctl -t]


SMART Selective self-test log data structure revision number 1
 SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS
    1        0        0  Not_testing
    2        0        0  Not_testing
    3        0        0  Not_testing
    4        0        0  Not_testing
    5        0        0  Not_testing
Selective self-test flags (0x0):
  After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.





Drive 2:

[root@borg rsbackup]# smartctl -a /dev/sdf
smartctl version 5.38 [x86_64-redhat-linux-gnu] Copyright (C) 2002-8 Bruce Allen
Home page is http://smartmontools.sourceforge.net/

=== START OF INFORMATION SECTION ===
Device Model:     Hitachi HDS721010CLA332
Serial Number:    JP2940HD032PMC
Firmware Version: JP4OA3EA
User Capacity:    1,000,204,886,016 bytes
Device is:        Not in smartctl database [for details use: -P showall]
ATA Version is:   8
ATA Standard is:  ATA-8-ACS revision 4
Local Time is:    Sat Feb  5 20:08:10 2011 EST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status:  (0x84)	Offline data collection activity
					was suspended by an interrupting command from host.
					Auto Offline Data Collection: Enabled.
Self-test execution status:      (   0)	The previous self-test routine completed
					without error or no self-test has ever 
					been run.
Total time to complete Offline 
data collection: 		 (10517) seconds.
Offline data collection
capabilities: 			 (0x5b) SMART execute Offline immediate.
					Auto Offline data collection on/off support.
					Suspend Offline collection upon new
					command.
					Offline surface scan supported.
					Self-test supported.
					No Conveyance Self-test supported.
					Selective Self-test supported.
SMART capabilities:            (0x0003)	Saves SMART data before entering
					power-saving mode.
					Supports SMART auto save timer.
Error logging capability:        (0x01)	Error logging supported.
					General Purpose Logging supported.
Short self-test routine 
recommended polling time: 	 (   1) minutes.
Extended self-test routine
recommended polling time: 	 ( 175) minutes.
SCT capabilities: 	       (0x003d)	SCT Status supported.
					SCT Feature Control supported.
					SCT Data Table supported.

SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE      UPDATED  WHEN_FAILED RAW_VALUE
  1 Raw_Read_Error_Rate     0x000b   094   094   016    Pre-fail  Always       -       786447
  2 Throughput_Performance  0x0005   134   134   054    Pre-fail  Offline      -       100
  3 Spin_Up_Time            0x0007   120   120   024    Pre-fail  Always       -       301 (Average 329)
  4 Start_Stop_Count        0x0012   100   100   000    Old_age   Always       -       21
  5 Reallocated_Sector_Ct   0x0033   100   100   005    Pre-fail  Always       -       0
  7 Seek_Error_Rate         0x000b   100   100   067    Pre-fail  Always       -       0
  8 Seek_Time_Performance   0x0005   140   140   020    Pre-fail  Offline      -       30
  9 Power_On_Hours          0x0012   100   100   000    Old_age   Always       -       2252
 10 Spin_Retry_Count        0x0013   100   100   060    Pre-fail  Always       -       0
 12 Power_Cycle_Count       0x0032   100   100   000    Old_age   Always       -       19
192 Power-Off_Retract_Count 0x0032   100   100   000    Old_age   Always       -       21
193 Load_Cycle_Count        0x0012   100   100   000    Old_age   Always       -       21
194 Temperature_Celsius     0x0002   253   253   000    Old_age   Always       -       23 (Lifetime Min/Max 18/30)
196 Reallocated_Event_Count 0x0032   100   100   000    Old_age   Always       -       0
197 Current_Pending_Sector  0x0022   100   100   000    Old_age   Always       -       0
198 Offline_Uncorrectable   0x0008   100   100   000    Old_age   Offline      -       0
199 UDMA_CRC_Error_Count    0x000a   200   200   000    Old_age   Always       -       0

SMART Error Log Version: 0
No Errors Logged

SMART Self-test log structure revision number 1
No self-tests have been logged.  [To run self-tests, use: smartctl -t]


SMART Selective self-test log data structure revision number 1
 SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS
    1        0        0  Not_testing
    2        0        0  Not_testing
    3        0        0  Not_testing
    4        0        0  Not_testing
    5        0        0  Not_testing
Selective self-test flags (0x0):
  After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
 
Great... the new drive is failing too, and another one is failing. I'm at 3 failing drives now... one with 2 read error rate, one with like 65 thousand, and the other with a CRC error.

So this is going to be the last Hitachi's I buy... Going to go with WD or something, they seem to be more dependable based on reviews.
 
RAW_READ_ERROR_RATE and UDMA_CRC_Error_Count are usually a sign of a bad cable or SATA controller/port, rather than a bad drive. I wouldn't be so quick to blame the drives if you haven't tested them on another controller or with a different cable.
 
Raw read error rate should be non-zero; your HDD needs the ECC or it won't recover ALOT of sectors. This value 'loops' around, so it starts with 0 again so in reality the number of much bigger than is shown.

Some HDDs do not display the actual raw value of "raw read error rate" anymore, but only display normalized SMART threshold values, where the actual data value stays at 0. In essence, those disks aren't truthful about their SMART output.

Raw read error rate generally describes the quality of the media. The more ECC you need to correct bit errors, generally the less the quality. In my experience only older disks are honest about this value, and all my honest disks have non-zero values (like 3 billion or something; a large number).

So this is completely normal. :)
 
I think it depends on the HDD model and manufacturer. For Hitachis and Seagates big values are usually normal, even for new drives. With Samsung (and possibly WD) drives, it does in my experience often relate to actual errors. Their raw read error rate normally stays at 0, but starts climbing if the drive is unable to read a file (which often points to weak or bad sectors).
 
After more research and reading newegg reviews, it seems these drives are known for issues. (7k1000.c) Seems they are notorious for being DOA.

Time to order some WD's or something, and spend yet more money.

How would I troubleshoot to see if it's the sata cable or port? I don't really have any other drives to try and since these already have all sorts of errors and warnings on them, no use in trying them somewhere else now. Also an involved process given they are in raid 5.
 
If your data link with the harddrive (SATA interface) would show corruption, this will yield UDMA_CRC_ERROR_COUNT in the SMART output. So if that value is zero, there should be no problems with the cabling.

So far i think Samsung F4's are nicer than WD EARS, even the newest 3-platter drive which is a tad faster on sequential transfer but more importantly, is less slow when having to emulate 4K sectors.
 
Just took out one of the drives that had lot of errors - was actually a hot spare as I was going to take one of the other failing drives out and rebuild with the new one... but that one is failing too.

I put another drive in that same slot, this time I decided to format it with ext3 and do a cp /dev/zero to it.

I am now doing a copy of that file to the drive, that way I'm causing reads and writes. I'm almost done filling it's capacity. Is this a sufficient test? So far I see no errors so this drive seems good. This also rules out a cable issue (at least for that slot)

I have a feeling they won't accept my RMA requests though simply because the drives did not actually die, they just have lot of errors on them. Guess I can just throw them in my backup pool and hope they fail fast enough.
 
Weird, so on one of the drives that had 1 error, it's gone now. The drive that had like over 600000, it's down to 3. The value/worse are 99 and not 100 though.

So am I maybe worrying for nothing?

I also have yet another failing drive, but this one is a WD 500GB. It keeps randomly resetting. It was for another unrelated server. I am doing a full smart scan on another machine now just to see what happens. Was SO close to getting my openfiler setup ready, but had to run into yet another snag and yet another hard drive failure. I seem to have horrible luck with hard drives lately.
 
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