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What is electromigration?
Harris Semiconductor Lexicon of technical terms puts it this way:
"Motion of ions of a metal conductor (such as aluminum) in response to the passage of high current through it. Such motion can lead to the formation of "voids" in the conductor, which can grow to a size where the conductor is unable to pass current. Electromigration is aggravated at high temperature and high current density and therefore is a reliability "wear-out" process. Electromigration is minimized by limiting current densities and by adding metal impurities such as copper or titanium to the aluminum."
Electromigration is an effect that occurs when an extremely dense electron flow knocks off atoms within the wire and moves them, leaving a gap at one end and high stress at the other. In a chip, the formation of such a void will cause an open circuit and result in a failure. At the other end, the increase of stresses can cause fracture of the insulator around the wire and shorting.
Electromigration Simulator @ MIT
processing temperature -- increasing the processing temperature will increase the initial tensile stress present in the line due to thermal mismatch, thereby leading to earlier failures. To neglect the thermal stress, set the process temperature the same as the test temperature.
test temperature -- increasing the test temperature will dramatically reduce the calculation time since diffusivity is follows the temperature by an Arrhenius relationship.
This board is filled every day with people who have developed RAM errors, data corruption problems (generally RAM) ect, Most of which can be traced to either poor power regulation (Transient Response\Load regulation - overshoots) of the PSU, or ESD
Latent defects caused by ESD in any IC (and they are just everywhere from HDDs to NIC, CPU, RAM ect) are massively underated as a cause of problems. If you have eliminated power fluctuation problems (PSU voltage regulation and power conditioning) and still experience a component failure, odds are that it was a latent defect, either from installation, or one that wasnt caught during manufacturing.
the membership displays a cavalier attitude towards this issue for 2 reasons, RMA's are pretty easy, and they rarely employ the same component for its fully rated lifespan, upgrading before the eventual premature failure becomes appearent.
But
a latent defect, not only effects the lifespan, it degrades the performance of the IC as well, and is often the difference between the "Golden Chip" benchmark leader, the norm, and "why cant I get the same OC as this guy? Ive got the same components"
edit > well that gif sux on a black background
madmat said:It's also possible to blow holes in the insulating layers in stacked layers of IC's thus causing a short between layers which will lead to the death of the chip but usually when that happens the chip goes out rather noisily.
USMC2Hard4U said:What kills a CPU exactly?
Ever hear of a Heatsink called the "Thermoengine" Grrrrr
It ate 2 of my T-Birds...
AMDXPCottonFire22 said:This is a real dumb question for Overclocking....
But what really kills the CPU
Is it the voltage? Heat or the Speed increase?![]()